Ключевые слова: presentation, HTS, YBCO, coated conductors, RABITS process, fabrication, seed layers, substrate Ni-W, mechanical properties, ferromagnetic loss, roughness, critical caracteristics, critical current, buffer layers, long conductors, homogeneity, Jc/B curves, microstructure, films epitaxial, texture, template layers, nanoscaled effects
Ключевые слова: funding, plans, collaborations, HTS, YBCO, coated conductors, fibers, RABITS process, buffer layers, IBAD process, substrate Ni-W, planarization, presentation
Ключевые слова: presentation, HTS, YBCO, coated conductors, IBAD process, MOCVD process, commercialization, long conductors, fabrication, roughness, planarization, texture, substrate Hastelloy, microstructure, irradiation effects, growth rate, defects, pinning, critical caracteristics, critical current density, angular dependence, Jc/B curves, nanoscaled effects, nanodots, phase composition, defects columnar, homogeneity, critical current, thickness dependence
Ключевые слова: patents, HTS, coated conductors, buffer layers, fabrication, doping effect, YBCO, substrate Ni-W, MOD process
Maroni V.A., Goyal A., Specht E.D., Paranthaman M., Aytug T., Christen D.K., Kim K., Cantoni C., Zhang Y., Selvamanickam V., Chen Y., Zuev Y.L.
Ключевые слова: HTS, YBCO, coated conductors, buffer layers, pinning, PLD process, substrate SrTiO3, films, cap layers, nanoscaled effects, phase formation, phase separation, fabrication, microstructure, size effect, critical caracteristics, Jc/B curves, critical current density, angular dependence, experimental results
Ключевые слова: funding, plans, collaborations, HTS, YBCO, coated conductors, pinning centers, nanodoping, nanoscaled effects, defects columnar, fabrication, presentation
Goyal A., Cantoni C., Xie Y., Civale L., Zhang Y., Zhang Y., Selvamanickam V., Carota G., Chen Y., Zuev Y., Dackow J., Guevara A., Kesgin I., Coulter J.
Ключевые слова: presentation, HTS, YBCO, coated conductors, mechanical properties, stress effects, strain effects, critical caracteristics, critical current, joints, joint resistances, fibers, wires round, substrates, measurement technique, angular dependence, magnetic field dependence, REBCO, grain boundaries, pinning, critical temperature, pressure dependence, pinning force, Bi2223/Ag, tapes, cables, bending process, experimental results, power equipment, electromechanical analysis
Ключевые слова: presentation, HTS, YBCO, coated conductors, nanoscaled effects, nanodots, microstructure, nanorods, RABITS process, defects columnar
Ключевые слова: HTS, YBCO, coated conductors, buffer layers, fabrication, RABITS process, substrate Ni-W, MOD process, microstructure
Ключевые слова: patents, coated conductors, HTS, RABITS process, buffer layers, films epitaxial, deposition setup, design
Ключевые слова: HTS, YBCO, MOD process, RABITS process, fabrication, plans, collaborations, funding, coated conductors, presentation
Maroni V.A., Goyal A., Paranthaman M., Aytug T., Heatherly L., Kim K., Zhang Y., Selvamanickam V., Chen Y., Zuev Y.
Ключевые слова: HTS, YBCO, coated conductors, MOCVD process, IBAD process, fabrication
Ключевые слова: HTS, YBCO, coated conductors, MOCVD process, IBAD process, fabrication, buffer layers, critical caracteristics, doping effect, pilot-scale, presentation
Ключевые слова: presentation, HTS, YBCO, coated conductors, fabrication, MOCVD process, IBAD process, buffer layers, substrate Hastelloy, roughness, critical caracteristics, Jc/B curves, angular dependence, doping effect, microstructure, long conductors, coils pancake, critical current, pilot-scale, homogeneity
Ключевые слова: HTS, YBCO, coated conductors, wires round, fibers, substrate Ni-W, substrate Ni-Mo, RABITS process, fabrication, critical caracteristics, Jc/B curves, texture, IBAD process, plans, funding, presentation
Ключевые слова: plans, funding, HTS, YBCO, coated conductors, nanoscaled effects, fabrication, critical caracteristics, presentation
Goyal A., Paranthaman M., Lee D., Aytug T., Cantoni C., Zhang Y., Selvamanickam V., Chen Y., Zuev Y., Specht E.
Goyal A., Specht E.D., Aytug T., Christen D.K., Paranthaman M.P., Thompson J.R., Cantoni C., Zhang Y., Selvamanickam V., Chen Y., Zuev Y.L., Sinclair J.W.
Ключевые слова: HTS, YBCO, coated conductors, RABITS process, funding, template layers, fabrication, microstructure, texture, substrate Ni-W, plans, collaborations, presentation
Ключевые слова: HTS, YBCO, coated conductors, MOCVD process, IBAD process, buffer layers, nanoscaled effects, template layers, long conductors, capacity, fabrication, microstructure, Jc/B curves, doping effect, REBCO, angular dependence, pinning force, texture, current-voltage characteristics, critical current, homogeneity, thickness dependence, presentation, critical caracteristics
Ключевые слова: HTS, YBCO, coated conductors, MOCVD process, fabrication, IBAD process, funding, pilot-scale, template layers, pinning, REBCO, high rate process, plans, collaborations, presentation
Ключевые слова: presentation, HTS, coated conductors, substrate Ni-W, buffer layers, RABITS process, grain structure, texture, critical current density, thickness dependence, MOD process, high rate process, critical current, angular dependence, Jc/B curves, seeding technique, microstructure, fabrication, films, substrate sapphire, fibers, wires round, YBCO, critical caracteristics
Ключевые слова: HTS, coated conductors, substrate Ni-W, buffer layers, RABITS process, grain structure, texture, critical current density, MOD process, high rate process, fabrication, films, substrate sapphire, fibers, wires round, plans, collaborations, YBCO, funding, critical caracteristics, presentation
Ключевые слова: HTS, YBCO, coated conductors, buffer layers, MOD process, seed layers, RABITS process, texture, microstructure, fabrication
Ключевые слова: HTS, coated conductors, IBAD process, YBCO, long conductors, REBCO, substrate Ni-W, MOD process, reel-to-reel process, critical current, review, Korea, Bi2223, tapes, cables, FCL, coated conductors, China, presentation, power equipment, critical caracteristics, fabrication, status
Ключевые слова: presentation, HTS, YBCO, coated conductors, IBAD process, MOCVD process, fabrication, microstructure, buffer layers, high rate process, critical current, thickness dependence, oxygenation treatments, REBCO, magnetic field dependence, critical current density, Jc/B curves, angular dependence, texture, nanodots, pinning, critical caracteristics
Ключевые слова: HTS, YBCO, coated conductors, IBAD process, RABITS process, nanoscaled effects, pinning mechanism, defects columnar, fabrication, presentation
Ключевые слова: presentation, HTS, YBCO, coated conductors, substrate metallic, RABITS process, mechanical properties, films epitaxial, buffer layers, IBAD process, template layers, MOD process, PVD process, comparison, seed layers, texture, substrate Ni-W, joints, microstructure, critical current, magnetic field dependence, PLD process, critical caracteristics, fabrication
Ключевые слова: HTS, coated conductors, YBCO, nanoscaled effects, pinning, ac losses, REBCO, PLD process, LTG process, fabrication, measurement technique, Hall sensor, presentation
Martin P., Paranthaman M., Thompson J.R., Kang S., Li J., Goyal A.(goyala@ornl.gov), Ijaduola A.
Rupich M.W., Li X., Zhang W., Kodenkandath T., Goyal A., Aytug T., Paranthaman M.P., Leonard K.J., Sathyamurthy S., Bhuiyan M.S., Kim K., Martin P.M., Li J., Fayek M.
Rupich M.W., Li X., Zhang W., Kodenkandath T., Goyal A., Specht E.D., Paranthaman M., Martin P.M., Li J., Gapud A.
Zhang W., Huang Y., Li X., Kodenkandath T., Rupich M.W., Schoop U., Verebelyi D.T., Thieme C.L., Siegal E., Holesinger T.G., Maiorov B., Civale L., Miller D.J., Maroni V.A., Li J., Martin P.M., Specht E.D., Goyal A., Paranthaman M.P.
Ключевые слова: HTS, YBCO, coated conductors, RABITS process, substrate Ni-W, seed layers, comparison, texture, fabrication
Ключевые слова: HTS, REBCO, RABITS process, nanodots, YBCO, comparison, Jc/B curves, angular dependence, experimental results, fabrication, critical caracteristics
Kodenkandath T., Rupich M., Goyal A., Paranthaman M., Xu Y., Marken K., Chaudhuri T., Bhattacharya R., Bhattacharya R., Phok S.
Ключевые слова: HTS, coated conductors, buffer layers, electrodeposition, minimum quench energy, presentation, fabrication
Ключевые слова: patents, HTS, coated conductors, substrate metallic, texture, fabrication
Paranthaman M., Christen D.K., Heatherly L., Thompson J.R., Kang S., Lee D.F., List F.A., Martin P.M., Gapud A.A., Li J., Goyal A.(goyala@ornl.gov)
Ключевые слова: HTS, YBCO, coated conductors, RABITS process, nanodots, defects columnar, angular dependence, temperature dependence, pinning, fabrication
Goyal A., Heatherly L., Martin P.M., Wee S.H.(wees@ornl.gov)
Ключевые слова: HTS, REBCO, RABITS process, PLD process, films epitaxial, coated conductors, Jc/B curves, angular dependence, fabrication, critical caracteristics
Thieme C.L., Goyal A., Ekin J.W., Qiao Y., Cheggour N., Clickner C.C.(clickner@boulder.nist.gov), Xie Y.-Y
Goyal A., Paranthaman M., Heatherly L., Martin P.M., Li J., Wee S.H.(wees@ornl.gov)
Thieme C.L., Li X., Kodenkandath T., Goyal A., Heatherly L., Sathyamurthy S., Martin P.M., Rupich M.W.(mrupich@amsuper.com), Paranthaman M.P.(paranthamanm@ornl.gov)
Ключевые слова: HTS, YBCO, coated conductors, MOD process, buffer layers, chemical solution deposition, substrate Ni-W, fabrication
Goyal A., Paranthaman M., Aytug T., Christen D.K., Heatherly L., Leonard K.J., Thompson J.R., Kang S., Martin P.M., Ijaduola A.O., Rusakova I., Meng R., Chu C.W.(cwchu@uh.edu)
Ключевые слова: HTS, YBCO, films, substrate metallic, substrate single crystal, nanoscaled effects, nanoscaled roughness, pinning, Jc/B curves, temperature dependence, pinning force, irreversibility fields, angular dependence, microstructure, experimental results, critical caracteristics, magnetic properties
Ключевые слова: substrate metallic, powder metallurgy, texture, HTS, fabrication, patents
Goyal A., Martin P., Leonard K., Xu Y.(yxu@ues.com)
Rupich M.W., Schoop U., Thieme C., Li X., Zhang W., Kodenkandath T., Nguyen N., Siegal E., Goyal A., Paranthaman M., Verebelyi D.T., Civale L., Maiorov B., Holesinger T.
Rupich M.W., Thieme C.L., Schoop U., Li X., Zhang W., Kodenkandath T., Goyal A., Verebelyi D.T., Paranthaman M.P., Sathyamurthy S., Bhuiyan M.S.
Ключевые слова: HTS, YBCO, coated conductors, precursors, substrate Ni-W, MOD process, PVD process, fabrication
Goyal A., Heatherly L., Kang S., Barnes P.N., Campbell T.A., Haugan T.J.(timothy.haugan@wpafb.af.mil), Gapud A.
Ключевые слова: HTS, YBCO, coated conductors, RABITS process, substrate Ni alloy, pinning, Jc/B curves, microstructure, fabrication, experimental results, critical caracteristics
Goyal A., Paranthaman M., Heatherly L., Leonard K.J., Lee D.F., List F.A., Cook S.W., Martin P.M., Rouleau C.M., Christen H.M.(christenhm@ornl.gov)
Goyal A., Paranthaman M., Heatherly L., Leonard K.J., Lee D.F.(leedf@ornl.gov), List F.A., Cook S.W., Martin P.M., Christen H.M., Rouleau C.M.
Ключевые слова: HTS, YBCO, coated conductors, pulsed electron deposition, ex-situ process, RABITS process, precursors, Jc/B curves, fabrication, critical caracteristics
Lee D.F., Cantoni C., Rutter N., Goyal A.(goyala@ornl.gov)
Specht E.D., Paranthaman M., Christen D.K., Leonard K.J., Thompson J.R., Kang S., List F.A., Martin P.M., Varela M., Pennycook S.J., Ijaduola A.O., Gapud A.A., Goyal A.(goyala@ornl.gov)
Ключевые слова: HTS, YBCO, films, nanodots, defects columnar, pinning, microstructure, Jc/B curves, anisotropy, fabrication, experimental results, critical caracteristics
Schoop U., Li X., Kodenkandath T., Rupich M., Goyal A., Paranthaman M., Sathyamurthy S., Lee D.F., Bhuiyan M.S.(bhuiyanms@ornl.gov), Payzant E.A.(payzanta@ornl.gov)
Ключевые слова: HTS, YBCO, coated conductors, RABITS process, buffer layers, solution techniques, fabrication
Goyal A., Paranthaman M., Aytug T., Christen D.K., Leonard K.J., Thompson J.R., Martin P.M., Zhai H.Y., Gapud A.A.
Ключевые слова: HTS, YBCO, coated conductors, RABITS process, seed layers, barriers, oxygen diffusion, Jc/B curves, fabrication, critical caracteristics
Rupich M.W., Thieme C., Li X., Kodenkandath T., Goyal A., Paranthaman M., Aytug T., Christen D.K., Budai J.D., Cantoni C., Gapud A.A., Schoop U.(uschoop@amsuper.com), Kim K.(kyz@ornl.gov)
Goyal A., Aytug T., Christen D.K., Paranthaman M.P., Cantoni C., Gapud A.A., Kim K.(kkim@mse.ufl.edu), Norton D.P.
Ключевые слова: HTS, YBCO, coated conductors, buffer layers, PLD process, substrate SrTiO3, texture, resistivity, temperature dependence, fabrication
Thieme C.L., Goyal A., Marken K., Ijaduola A.O., Thompson J.R.(jrt@utk.edu)
Ключевые слова: HTS, coated conductors, substrate Ni-W, RABITS process, magnetic hysteresis, ac losses, experimental results, magnetic properties, fabrication
Thieme C., Goyal A., Specht E.D., Xu Y., Christen D.K., Thompson J.R., Cantoni C., Varela M., Pennycook S.J.
Goyal A., Paranthaman M., Leonard K.J., Sathyamurthy S., Kroeger D.M., Lee D.F.(leedf@ornl.gov), Jr L.H., Yoo J., List F.A., Rutter N., Cook S.W., Martin P.M.
Goyal A., Heatherly L., Kroeger D.M., Lee D.F., List F.A., Rutter A.(nar20@cam.ac.uk), Vallet C.E.
Ключевые слова: HTS, YBCO, coated conductors, substrate Ni-W, substrate Cu alloy, microstructure, experimental results, magnetic properties
Goyal A., Paranthaman M., Christen D.K., Leonard K.J., Thompson J.R., Martin P.M., Zhai H.Y., Aytug T.(aytugt@ornl.gov), Gapud A.A.
Goyal A., Paranthaman M., Heatherly L., Leonard K.J., Kroeger D.M., Lee D.F., List F.A., Martin P.M., Cook S., Gapud A.A., Yoo J.(yooj@ornl.gov), Hsu H.S.
Verebelyi D.T.(dverebelyi@amsuper.com), Schoop U., Thieme C., Li X., Zhang W., Kodenkandath T., Malozemoff A.P., Nguyen N., Siegal E., Buczek D., Lynch J., Scudiere J., Rupich M., Goyal A., Specht E.D., Martin P., Paranthaman M.
Goyal A., Paranthaman M., Aytug T., Salama K., Sathyamurthy S., Bhuiyan M.S., Kang S., Lee D.F., Payzant E.A.
Ключевые слова: HTS, YBCO, coated conductors, substrate Ni-W, buffer layers, MOD process, microstructure, experimental results, fabrication, magnetic properties
Thieme C.L., Goyal A., Verebelyi D.T., Cheggour N.(cheggour@boulder.nist.gov), Ekin J.W., Clickner C.C., Feenstra R.
Schoop U., Thieme C., Li X., Zhang W., Kodenkandath T., Malozemoff A.P., Nguyen N., Siegal E., Buczek D., Lynch J., Scudiere J., Goyal A., Paranthaman M., Verebelyi D.T., Jowett M., Rupich M.W.(mrupich@amsuper.com), Thompson E., Wang J.-., Li Q., Annavarapu S., Cui S., Fritzemeier L., Aldrich B., Craven C., Niu F., Schwall R.
Ключевые слова: HTS, YBCO, coated conductors, substrate Ni-W, MOD process, critical current, fabrication, critical caracteristics
Goyal A., Paranthaman M., Verebelyi D.T., Ekin J.W., Clickner C.C., Feenstra R., Cheggour N., Thieme C.L.H.
Goyal A., Christen D.K., Heatherly L., List F.A., Christen H.M., Cantoni C.(cantonic@ornl.gov), Ownby G.W., Zehner D.M., Rouleau C.M.
Ключевые слова: HTS, coated conductors, RABITS process, substrate Ni, seed layers, microstructure, experimental results, fabrication
Goyal A., Paranthaman M.P., Cantoni C., Martin P.M., Christen H.M., Sathyamurthy S.(sathyamurths@ornl.gov), Zhai H-Y, Kung S.
Aytug T., Paranthaman M., Kang S., Zhai H.Y., Leonard K.J., Vallet C.E., Sathyamurthy S., Christen H.M., Goyal A., Christen D.K.
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